MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials StdVol-Equipment Automation Software for instance wafers or sheets

for instance wafers or sheets

sale and customer acceptance of module

polyethylene (PE)

This Test Method may also be applied to any leadframe materials with thickness ≤0

本仕様は，プラスチックモールドS

MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials StdVol-Equipment Automation Software for instance wafers or sheetsThe determination of conductivity type and the presence of junctions in semiconductors is important in processing or inspection of semiconducting materials for device fabrication as well as in research and development. This Test Method covers four procedures that are widely used for making routine measurements. This Test Method covers the determination of the conductivity type of extrinsic semiconductors. While explicit details are given for germanium