T01200 - SEMI T12 - Specification for Tracing Jigs and Implements StdPbc-1114 It does not measure the

It does not measure the free-form shape of the wafer

When this Test Method was developed in the 1970s

1-0821 (first published)

1 — Specification for SECS-II Protocol for Prober Specific Equipment Model for 300 mm Environment (PSEM300)

but to specify the test method to be used when testing for parameters covered by this Test Method

T01200 - SEMI T12 - Specification for Tracing Jigs and Implements StdPbc-1114 It does not measure theThis standard was technically approved by the global Traceability Committee and is the direct responsibility of the Japanese Traceability Committee. Current edition approved by the Japanese Regional Standards Committee on November 24, 2004. Initially available at www. semi. org January 2005. Originally published March 2004; previously published July 2004. NOTICE: The designation of SEMI T12 was updated during the 0710 publishing cycle to reflect the