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F02000 - SEMI F20 - 用于通用、高纯和超高纯半导体制造组件的316L不锈钢棒材、锻材、挤压型材、板材和管材的规范 Revision:SEMI F20-0706E (Reapproved 0917) - Superseded SEMI M38-1101 (technical revision)

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Description

SEMI M38-1101 (technical revision)

SEMI E82-0704 (technical revision)

at a delivery point agreed between the supplier and user

This Test Method covers measurement of the thickness of silicon wafers

completion

F02000 - SEMI F20 - 用于通用、高纯和超高纯半导体制造组件的316L不锈钢棒材、锻材、挤压型材、板材和管材的规范 Revision:SEMI F20-0706E (Reapproved 0917) - Superseded SEMI M38-1101 (technical revision)NOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. 316L ASTM A276ASTM A240ASTM A269ASTM A632316L

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