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SEMI D31-0213 (technical revision)
This Test Method is applicable to slices of silicon with resistivity higher than 3 ·cm for p-type and higher than 1 ·cm for n-type
SEMI E63-0223 (technical revision)
previously published March 2006
and specifies which protocol to use for precise time synchronization of clocks in factory environments that use network communication
G02400 - SEMI G24 - パッケージ・リード間の容量および付加容量の測定のための試験方法 StdPbc-0723 SEMI D31-0213 (technical revision)global Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org19841989 : Referenced SEMI Standards None.
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