MF039800 - SEMI MF398 - Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum StdPbc-1112 suitable sampling techniques must be

suitable sampling techniques must be employed

This Specification covers reclaim wafers that are either customer-supplied or third party-sourced

flatted or notched compound semiconductor wafers

there is a potential for reduced floor space and facility connections to the equipment

は，公式でなく，参考値である。また，SI値の正確な変換値でない場合もある。

MF039800 - SEMI MF398 - Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum StdPbc-1112 suitable sampling techniques must beThis standard was technically approved by the global Silicon Wafer Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on November 21, 2006. It was available at www. semi. org in February 2007. Originally published by ASTM International as ASTM F398 74T; previously published as SEMI MF398 92 (Reapproved 2002) NOTICE: This document was balloted and approved for withdrawal in 2007. This test method covers